IL

Ilya Leizerson

EC Elbit Systems Land And C4I: 8 patents #1 of 48Top 3%
EC Elbit Systems C4I And Cyber: 4 patents #2 of 35Top 6%
OR Orbotech: 2 patents #49 of 175Top 30%
TL Technion Research & Development Foundation Limited: 1 patents #488 of 1,205Top 45%
📍 Netanya, IL: #64 of 1,776 inventorsTop 4%
Overall (All Time): #290,979 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
11836964 Devices, systems and methods for scene image acquisition Yaron Mayerowicz 2023-12-05
11783564 Contactless parameters measurement system and method Reuven Dahan, Yaron Mayerowicz, Aviv Elisha 2023-10-10
11734833 Systems and methods for detecting movement of at least one non-line-of-sight object Alon Refael Heimer, Barak Alfassi, Yaron Mayerowicz 2023-08-22
11734834 Systems and methods for detecting movement of at least one non-line-of-sight object Alon Refael Heimer, Barak Alfassi, Yaron Mayerowicz 2023-08-22
11692810 Photoacoustic excitation sensing enhanced by cross-correlated unfocused speckle images Barak Alfassi, Alon Refael Heimer, Sharone Aloni, Adam Wolff 2023-07-04
11609092 System and method for determining real-world geographic locations of multiple members Ezra Zamir, Gavriel Davidov, Tal Fromm, Arie Vainstein, Naphtaly Voichek +1 more 2023-03-21
11523737 System and method for determining audio characteristics from within a body Barak Alfassi 2022-12-13
11435296 Method and system for grading gemstones 2022-09-06
11371878 Optical detection of vibrations Dan Nussinson 2022-06-28
11187648 Two-stage photo-acoustic excitation sensing systems and methods Adi Sussholz, David Stavitsky 2021-11-30
10321825 System and method for determining audio characteristics from within a body Barak Alfassi 2019-06-18
10235584 System for object authenticity detection including a reference image acquisition module and a user module and methods therefor 2019-03-19
10043055 System and method for object authenticity detection Adi Sussholz 2018-08-07
7795887 Photoconductive based electrical testing of transistor arrays Arie Glazer, Abraham Gross, Raanan Adin, Raphael Ben-Tolila 2010-09-14
7391510 System and method for inspecting patterned devices having microscopic conductors Raphael Ben-Tulila, Emil Berladsky, Ofer Saphier 2008-06-24
7177030 Determination of thin film topography Stephen G. Lipson 2007-02-13