Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11035806 | Devices and systems for improved collection efficiency and resolution of wavelength dispersive spectrometry | — | 2021-06-15 |
| 10656106 | Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes | — | 2020-05-19 |
| 10614997 | Systems and methods for high energy X-ray detection in electron microscopes | — | 2020-04-07 |
| 9791390 | Devices and systems for spatial averaging of electron backscatter diffraction patterns | Stuart Ian Wright, Matthew McBride Nowell, Scott Lindeman | 2017-10-17 |
| 8155270 | Synergistic energy-dispersive and wavelength-dispersive X-ray spectrometry | David B. Rohde, Gregory S. Fritz | 2012-04-10 |
| 8027811 | Processing of spectrometer pile-up events | Gregory S. Fritz, Thomas B. Jacobs, Dean A. Stocker, Dale Anders Wade | 2011-09-27 |
| 7567871 | Automatic material labeling during spectral image data acquisition | David B. Rohde | 2009-07-28 |
| 6555817 | Method and apparatus for correcting magnetic field distortions in electron backscatter diffraction patterns obtained in an electron microscope | David B. Rohde | 2003-04-29 |
| 5440124 | High mass resolution local-electrode atom probe | Thomas F. Kelly, David J. Larson, Louis M. Holzman, Sateeshchandra S. Bajikar | 1995-08-08 |
| 5347132 | Position sensitive detector providing position information with enhanced reliability and performance | Louis M. Holzman, Thomas F. Kelly | 1994-09-13 |