Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6212943 | Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment on waste water | Yang Wang, Norman Nardelli, L. Jonathan Kramer | 2001-04-10 |
| 6062070 | Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste water | Yang Wang, Norman Nardelli, L. Jonathan Kramer | 2000-05-16 |
| 5987994 | Ultrasonic method for material monitoring | L. Jonathan Kramer, Glen Mitchell | 1999-11-23 |
| 5835454 | Transducer shroud for improved transducer operation in the treatment of waste water | — | 1998-11-10 |
| 5777550 | High reliability instrument system | Glen Mitchell, Mort Gorowitz | 1998-07-07 |
| 5760309 | Ultrasonic method for material monitoring | L. Jonathan Kramer, Glen Mitchell | 1998-06-02 |
| 5539670 | Coating responsive material condition monitoring system | L. Jonathan Kramer, Steven Petersen | 1996-07-23 |
| 5510779 | Error compensating instrument system with digital communications | L. Jonathan Kramer, Leslie D. Horrocks, deceased, by Maureen Horrocks, executrix, David M. Stern | 1996-04-23 |
| 4849754 | Remotely calibratable instrument system | Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen | 1989-07-18 |
| 4757252 | Probe system for measuring the condition of materials | Edward R. Woerner, Thomas E. Meacham, Jr., Steven Petersen | 1988-07-12 |
| 4723122 | Remotely calibratable instrument system | Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen | 1988-02-02 |
| 4573040 | Fail-safe instrument system | L. Jonathan Kramer | 1986-02-25 |
| 4568874 | RF Admittance apparatus and method for monitoring the contents of a pipe | L. Jonathan Kramer | 1986-02-04 |
| 4511948 | Two layer probe | Kenneth M. Loewenstern, Jack G. Benning, Jr. | 1985-04-16 |
| 4428026 | Two layer probe | Kenneth M. Loewenstern, Jack G. Benning, Jr. | 1984-01-24 |
| 4363030 | Fail-safe instrument system | L. Jonathan Kramer | 1982-12-07 |
| 4332167 | Method of making an RF admittance measuring probe and product thereof | Robert J. Sun | 1982-06-01 |
| 4301681 | Method of using capacitor probe with a semiconductive electrode | Kenneth M. Loewenstern, Jack G. Benning, Jr. | 1981-11-24 |
| 4235106 | System and method for obtaining compensated level measurements | David M. Stern | 1980-11-25 |
| 4208909 | Admittance sensing probe having multiple sensing elements | L. Jonathan Kramer | 1980-06-24 |