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USPTO Patent Rankings Data through Dec 31, 2025
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Frederick L. Maltby — 20 Patents

DCDrexelbrook Controls: 15 patents #1 of 21Top 5%
DEDrexelbrook Engineering: 4 patents #1 of 5Top 20%
AMAmetek: 1 patents #70 of 215Top 35%
Abington, PA: #7 of 233 inventorsTop 4%
Pennsylvania: #3,419 of 74,527 inventorsTop 5%
Overall (All Time): #214,803 of 4,157,543Top 6%
20 Patents All Time
Frederick L. Maltby has been granted 20 US patents while listed as an inventor at Drexelbrook Controls. The first was granted in 1980 and the most recent in April 2001. Frederick L. Maltby ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Frederick L. Maltby in Abington, PA, US.

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
6212943 Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment on waste water Yang Wang, Norman Nardelli, L. Jonathan Kramer 2001-04-10 $7,794,000
6062070 Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste water Yang Wang, Norman Nardelli, L. Jonathan Kramer 2000-05-16
5987994 Ultrasonic method for material monitoring L. Jonathan Kramer, Glen Mitchell 1999-11-23
5835454 Transducer shroud for improved transducer operation in the treatment of waste water 1998-11-10
5777550 High reliability instrument system Glen Mitchell, Mort Gorowitz 1998-07-07
5760309 Ultrasonic method for material monitoring L. Jonathan Kramer, Glen Mitchell 1998-06-02
5539670 Coating responsive material condition monitoring system L. Jonathan Kramer, Steven Petersen 1996-07-23
5510779 Error compensating instrument system with digital communications L. Jonathan Kramer, Leslie D. Horrocks, deceased, by Maureen Horrocks, executrix, David M. Stern 1996-04-23
4849754 Remotely calibratable instrument system Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen 1989-07-18
4757252 Probe system for measuring the condition of materials Edward R. Woerner, Thomas E. Meacham, Jr., Steven Petersen 1988-07-12
4723122 Remotely calibratable instrument system Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen 1988-02-02
4573040 Fail-safe instrument system L. Jonathan Kramer 1986-02-25
4568874 RF Admittance apparatus and method for monitoring the contents of a pipe L. Jonathan Kramer 1986-02-04
4511948 Two layer probe Kenneth M. Loewenstern, Jack G. Benning, Jr. 1985-04-16
4428026 Two layer probe Kenneth M. Loewenstern, Jack G. Benning, Jr. 1984-01-24
4363030 Fail-safe instrument system L. Jonathan Kramer 1982-12-07
4332167 Method of making an RF admittance measuring probe and product thereof Robert J. Sun 1982-06-01
4301681 Method of using capacitor probe with a semiconductive electrode Kenneth M. Loewenstern, Jack G. Benning, Jr. 1981-11-24
4235106 System and method for obtaining compensated level measurements David M. Stern 1980-11-25
4208909 Admittance sensing probe having multiple sensing elements L. Jonathan Kramer 1980-06-24