| 6212943 |
Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment on waste water |
Yang Wang, Norman Nardelli, L. Jonathan Kramer |
2001-04-10 |
| 6062070 |
Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste water |
Yang Wang, Norman Nardelli, L. Jonathan Kramer |
2000-05-16 |
| 5987994 |
Ultrasonic method for material monitoring |
L. Jonathan Kramer, Glen Mitchell |
1999-11-23 |
| 5835454 |
Transducer shroud for improved transducer operation in the treatment of waste water |
— |
1998-11-10 |
| 5777550 |
High reliability instrument system |
Glen Mitchell, Mort Gorowitz |
1998-07-07 |
| 5760309 |
Ultrasonic method for material monitoring |
L. Jonathan Kramer, Glen Mitchell |
1998-06-02 |
| 5539670 |
Coating responsive material condition monitoring system |
L. Jonathan Kramer, Steven Petersen |
1996-07-23 |
| 5510779 |
Error compensating instrument system with digital communications |
L. Jonathan Kramer, Leslie D. Horrocks, deceased, by Maureen Horrocks, executrix, David M. Stern |
1996-04-23 |
| 4849754 |
Remotely calibratable instrument system |
Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen |
1989-07-18 |
| 4757252 |
Probe system for measuring the condition of materials |
Edward R. Woerner, Thomas E. Meacham, Jr., Steven Petersen |
1988-07-12 |
| 4723122 |
Remotely calibratable instrument system |
Richard Hall, Jonathan L. Kramer, Howard S. Hoopes, Steven Petersen |
1988-02-02 |
| 4573040 |
Fail-safe instrument system |
L. Jonathan Kramer |
1986-02-25 |
| 4568874 |
RF Admittance apparatus and method for monitoring the contents of a pipe |
L. Jonathan Kramer |
1986-02-04 |
| 4511948 |
Two layer probe |
Kenneth M. Loewenstern, Jack G. Benning, Jr. |
1985-04-16 |
| 4428026 |
Two layer probe |
Kenneth M. Loewenstern, Jack G. Benning, Jr. |
1984-01-24 |
| 4363030 |
Fail-safe instrument system |
L. Jonathan Kramer |
1982-12-07 |
| 4332167 |
Method of making an RF admittance measuring probe and product thereof |
Robert J. Sun |
1982-06-01 |
| 4301681 |
Method of using capacitor probe with a semiconductive electrode |
Kenneth M. Loewenstern, Jack G. Benning, Jr. |
1981-11-24 |
| 4235106 |
System and method for obtaining compensated level measurements |
David M. Stern |
1980-11-25 |
| 4208909 |
Admittance sensing probe having multiple sensing elements |
L. Jonathan Kramer |
1980-06-24 |