Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10121712 | Accelerated failure test of coupled device structures under direct current bias | Hessam Ghassemi, Andrew C. Lang | 2018-11-06 |
| 9568442 | Strain mapping in TEM using precession electron diffraction | Asher Calvin Leff | 2017-02-14 |
| 9099384 | Charge ordered vertical transistors | Steven J. May, Jonathan E. Spanier, James Rondinelli, Robert C. Devlin, Andrew M. Rappe | 2015-08-04 |