Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7859291 | Method of measuring on-resistance in backside drain wafer | — | 2010-12-28 |
| 4954456 | Fabrication method for high speed and high packing density semiconductor device (BiCMOS) | Kwang Soo Kim, Sang H. Chai, Young-sam Koo, Jin Ho Lee | 1990-09-04 |