Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11655951 | Lamp for vehicle | Kyung Su Lee, Woo Yeong Son | 2023-05-23 |
| 8097505 | Method of forming isolation layer in semiconductor device | — | 2012-01-17 |
| 8049265 | Semiconductor device and method of fabricating the same | — | 2011-11-01 |
| 7968366 | Image sensor and method for manufacturing the same | — | 2011-06-28 |
| 7888673 | Monitoring semiconductor device and method of manufacturing the same | — | 2011-02-15 |
| 7883950 | Semiconductor device having reduced polysilicon pattern width and method of manufacturing the same | — | 2011-02-08 |
| 7851235 | Test element group for monitoring leakage current in semiconductor device and method of manufacturing the same | — | 2010-12-14 |
| 7800107 | Test module for semiconductor device | — | 2010-09-21 |
| 7790609 | Method of forming metal line in semiconductor device | — | 2010-09-07 |
| 7723795 | Semiconductor memory device | — | 2010-05-25 |
| 7683409 | Image sensor | — | 2010-03-23 |
| 7683408 | Image sensor | — | 2010-03-23 |
| 7642186 | Metal line of semiconductor device and method of forming the same | — | 2010-01-05 |
| 7589021 | Copper metal interconnection with a local barrier metal layer | — | 2009-09-15 |
| 7544601 | Semiconductor device and a method for manufacturing the same | — | 2009-06-09 |
| 7482262 | Method of manufacturing semiconductor device | — | 2009-01-27 |
| 7439182 | Semiconductor device and method of fabricating the same | — | 2008-10-21 |
| 7368397 | Method for monitoring edge bead removal process of copper metal interconnection | — | 2008-05-06 |
| 7300866 | Method for fabricating metal line in a semiconductor | — | 2007-11-27 |
| 7238617 | Method for fabricating semiconductor device to minimize terminal effect in ECP process | — | 2007-07-03 |