Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12313682 | Method, system and device of serializing and de-serializing the delivery of scan test data through chip I/O to reduce the scan test duration of an integrated circuit | Amit Wangoo, Zhanwei Zhong | 2025-05-27 |
| 11927630 | System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test | — | 2024-03-12 |