Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11841396 | United states test controller for system-on-chip validation | Sameer Vaidya, Supaket Katchmart, Vivek Raghunath Khanzode, Pallavi Joshi, Henri Sutioso +1 more | 2023-12-12 |
| 9054740 | Low density parity check decoding with early termination based on nonzero-circulant flags | Shu Li, Panu Chaichanavong | 2015-06-09 |
| 8996952 | High-throughput iterative decoding's defect scan in retry mode of storage system channel | Shu Li, Yifei Zhang, Panu Chaichanavong | 2015-03-31 |
| 8661326 | Non-binary LDPC code decoding early termination | Shu Li, Panu Chaichanavong | 2014-02-25 |
| 8516347 | Non-binary LDPC extrinsic calculation unit (LECU) for iterative decoding | Shu Li, Panu Chaichanavong, Jun Gao | 2013-08-20 |