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Built-in-self-test using embedded memory and processor in an application specific intergrated circuit |
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Built-in-self-test using embedded memory and processor in an application specific integrated circuit |
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Built-in self-test using embedded memory and processor in an application specific integrated circuit |
Richard D. Taylor, Mark D. Montierth, Gary D. Zimmerman, John D. Marshall |
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Built-in self-test using embedded memory and processor in an application specific integrated circuit |
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2011-02-15 |
| 7418642 |
Built-in-self-test using embedded memory and processor in an application specific integrated circuit |
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System and method of recovering from soft memory errors |
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2005-11-29 |
