Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8607110 | I-R voltage drop screening when executing a memory built-in self test | Jae Hong Lee | 2013-12-10 |
| 8152372 | Methods for monitoring chip temperature during test | Jae Hong Lee | 2012-04-10 |