Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8689067 | Control of clock gate cells during scan testing | — | 2014-04-01 |
| 8443246 | Control of clock gate cells during scan testing | — | 2013-05-14 |
| 8214704 | Scan testing system and method | — | 2012-07-03 |
| 8024631 | Scan testing system and method | — | 2011-09-20 |
| 7895488 | Control of clock gate cells during scan testing | — | 2011-02-22 |
| 7739568 | Scan testing system for circuits under test | — | 2010-06-15 |