Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298126 | Operation accuracy measuring method | Atsushi Oda, Yoshinobu Saito | 2025-05-13 |
| 11474143 | Testing apparatus | Makoto Kobayashi, Okito Umehara, Yoshinobu Saito, Yusaku Ito, Kazunari Tamura | 2022-10-18 |
| 9953407 | Wafer inspection method and wafer inspection apparatus | Yusaku Ito, Tomoyuki Yaguchi | 2018-04-24 |
| 9881828 | Wafer processing method | Shinji Yoshida, Yusaku Ito | 2018-01-30 |
| 9616544 | Wafer inspection method and grinding and polishing apparatus | Yusaku Ito | 2017-04-11 |