Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10267636 | Method to test the quality factor of a MEMS gyroscope at chip probe | Sudheer S. Sridharamurthy, Tony Maraldo, Zheng-Yao Sun, Wenhua Zhang, Te-Hsi Lee +1 more | 2019-04-23 |
| 4977498 | Data processing system having a data memory interlock coherency scheme | Anne S. Valiton | 1990-12-11 |