Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5239260 | Semiconductor probe and alignment system | David C. Widder | 1993-08-24 |
| 5032788 | Test cell for non-contact opens/shorts testing of electrical circuits | Andrew J. LePage | 1991-07-16 |
| 4894605 | Method and on-chip apparatus for continuity testing | Reinhard Schumann, Elsworth Stearns, Tom Stylianos, Jr., John H. Sweeney | 1990-01-16 |