DL

David I-Chun Lee

DE Dexcom: 7 patents #175 of 397Top 45%
EI Electronics For Imaging: 1 patents #163 of 251Top 65%
Overall (All Time): #612,297 of 4,157,543Top 15%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11974845 System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson +2 more 2024-05-07
11714060 Automatic analyte sensor calibration and error detection Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia +19 more 2023-08-01
11656195 Automatic analyte sensor calibration and error detection Naresh C. Bhavaraju, Becky L. Clark, Vincent P. Crabtree, Chris W. Dring, Arturo Garcia +19 more 2023-05-23
11051731 System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson +2 more 2021-07-06
10729364 System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson +2 more 2020-08-04
10362975 System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson +2 more 2019-07-30
10327687 System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Rui Ma, Naresh C. Bhavaraju, Thomas Stuart Hamilton, Jonathan Hughes, Jeff Jackson +2 more 2019-06-25
8610932 Job based calibration, calibration guard, and profile advisor Michael Niles, Paul Michel, Jorge Juliao 2013-12-17