Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7008518 | Method and apparatus for monitoring optical characteristics of thin films in a deposition process | James H. Sternbergh, Eric Krisl | 2006-03-07 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7008518 | Method and apparatus for monitoring optical characteristics of thin films in a deposition process | James H. Sternbergh, Eric Krisl | 2006-03-07 |