Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8396281 | Apparatus and method for inspecting substrate internal defects | Jen-Ming Chang, Yen-Chun Chou, Cheng-Kai Chen, Jui-Yu Lin | 2013-03-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8396281 | Apparatus and method for inspecting substrate internal defects | Jen-Ming Chang, Yen-Chun Chou, Cheng-Kai Chen, Jui-Yu Lin | 2013-03-12 |