YL

Yu-Hsi Lee

DE Delta Electronics: 1 patents #1,366 of 2,746Top 50%
Overall (All Time): #3,151,089 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8396281 Apparatus and method for inspecting substrate internal defects Jen-Ming Chang, Yen-Chun Chou, Cheng-Kai Chen, Jui-Yu Lin 2013-03-12