Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11599437 | Method and system for intelligent failure diagnosis center for burn-in devices under test | Yun Xi, Yu Huang Lin, Meng Meng Jiang, Wen Sen Que, Hua Shan Liang +2 more | 2023-03-07 |