Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836134 | Apparatus and method for determining leakage current between a first semiconductor region and a second semiconductor region to be formed therein | John R. Fruth, Dean M. Dahlgnist | 2004-12-28 |
| 5034342 | Method of forming semiconductor stalk structure by epitaxial growth in trench | Douglas J. Yoder, David E. Moss | 1991-07-23 |
| 4993143 | Method of making a semiconductive structure useful as a pressure sensor | Douglas J. Yoder, David E. Moss | 1991-02-19 |
| 4975759 | Semiconductive stalk structure | Douglas J. Yoder, David E. Moss | 1990-12-04 |
| 4945769 | Semiconductive structure useful as a pressure sensor | Douglas J. Yoder, David E. Moss | 1990-08-07 |