LV

Leon C. Vandervalk

DE Defelsko: 15 patents #2 of 9Top 25%
Overall (All Time): #257,319 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10514328 Method and system for testing surfaces for contaminants Steven Nowell, Nicholas Williams 2019-12-24
9207174 Apparatus and method for characterizing a replica tape Robert V. Stachnik, James E. Davis 2015-12-08
9188672 Ultrasonic measuring gauge 2015-11-17
8994933 Apparatus and method for characterizing a replica tape Robert V. Stachnik, James E. Davis 2015-03-31
RE41342 Coating thickness gauge Frank Koch, David Beamish 2010-05-18
6343510 Ultrasonic testing using synthetic impulses Ian Neeson, Andre D. Chevrier 2002-02-05
6282962 High resolution ultrasonic thickness gauge Frank Koch, David Beamish 2001-09-04
6250160 High resolution ultrasonic thickness gauge Frank Koch, David Beamish 2001-06-26
6122968 Delay line for an ultrasonic probe and method of using same 2000-09-26
5979241 Delay line for an ultrasonic probe and method of using same 1999-11-09
5930744 Coating thickness gauge Frank Koch, David Beamish 1999-07-27
5777230 Delay line for an ultrasonic probe and method of using same 1998-07-07
5723791 High resolution ultrasonic coating thickness gauge Frank Koch, David Beamish 1998-03-03
RE35703 Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil Frank Koch, David Beamish 1997-12-30
5686831 Gauge with reversible display screen 1997-11-11
5623427 Nondestructive anodic capacity gauge Frank Koch 1997-04-22
5343146 Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil Frank Koch, David Beamish 1994-08-30
5325430 Encryption apparatus for computer device Brian J. Smyth 1994-06-28