Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6366081 | Method and apparatus for high throughput media defect testing using true reference value | Seng Ghee Tan, Teck Ee Loh, Udaya Silva | 2002-04-02 |
| 6201390 | Defect analysis in magnetic thin films | Jian-Ping Wang, Lea Peng Tan | 2001-03-13 |