TY

Taizo Yano

DT Daido Tokushuko: 1 patents #152 of 382Top 40%
Overall (All Time): #3,656,496 of 4,157,543Top 90%
1
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5934805 Method and an apparatus for flaw detection Toshio Endo, Tomikazu Yagi, Ryuzo Yamada, Nobuo Ishikawa 1999-08-10