Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6846597 | Photomask inspecting method | Syogo Narukawa, Kiyoshi Yamazaki, Yuji Machiya, Tatsuya TOMITA | 2005-01-25 |
| 6801824 | Substrate selector | Kouji Ishida, Kiyoshi Yamazaki, Hajime Seino | 2004-10-05 |