Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7945823 | Programmable address space built-in self test (BIST) device and method for fault detection | Ramesha Doddamane, Gopalakrishnan Perur Krishnan, Tarjinder Singh | 2011-05-17 |
| 7447958 | Parallel input/output self-test circuit and method | Gopalakrishnan Perur Krishnan, Tarjinder Singh Munday | 2008-11-04 |