Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6568849 | Temperature probe with improved structure integrity and operation reliability over high temperature and voltage | Shih-Chang Chen | 2003-05-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6568849 | Temperature probe with improved structure integrity and operation reliability over high temperature and voltage | Shih-Chang Chen | 2003-05-27 |