Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5835205 | Optical testing system for distinguishing a silicon carbide gemstone from a diamond | Charles Eric Hunter | 1998-11-10 |
| 5381103 | System and method for accelerated degradation testing of semiconductor devices | John Edmond, Douglas A. Asbury, Calvin H. Carter, Jr. | 1995-01-10 |
| 5008735 | Packaged diode for high temperature operation | John Edmond, Muni M. Mitchell, Mohammad Sedigh, Roman Hamerski | 1991-04-16 |