Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12140630 | Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test | Darren Tipton, Michael Simon, Florian Ramian | 2024-11-12 |
| 7532014 | LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers | Steffen Chladek | 2009-05-12 |