Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8424594 | Apparatus for thermal control in the analysis of electronic devices | Daniel C. Canfield, Frank Sauk, William Joseph Yost, III | 2013-04-23 |
| 7057410 | Interface structure for semiconductor integrated circuit test equipment | Paul Dana Wohlfarth, James Hannan, James R. Jordan | 2006-06-06 |
| 6876215 | Apparatus for testing semiconductor integrated circuit devices in wafer form | James Hannan, James R. Jordan, Phillip W. Sheeley | 2005-04-05 |