Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7516628 | On-line thickness gauge and method for measuring the thickness of a moving glass substrate | Kenneth C. Chen, Edward J. Lenhardt, Daniel Ma, James Peele Terrell, Jr. | 2009-04-14 |
| 6396039 | Focusing filament for autofocus system | — | 2002-05-28 |
| 6359686 | Inspection system for sheet material | James A. Ariglio, Ted Brownlee, Vincent Howell, Alan Ryder, Steven Shifman +1 more | 2002-03-19 |