Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299909 | Method and apparatus for high resolution measurement of a workpiece | Jeffrey T. Drake, Russell Wayne Madara, Jay Katsuhiko Stearns, Eric Daniel Treacy, David John Worthey +1 more | 2025-05-13 |
| 7776609 | Reference microplates and methods for making and using the reference microplates | David Andrew Pastel, Garrett Andrew Piech, Gordon M. Shedd, Mohamed A. Zainul | 2010-08-17 |
| 7674435 | Reference microplates and methods for making and using the reference microplates | David Andrew Pastel, Garrett Andrew Piech, Gordon M. Shedd, Mohamed A. Zainul | 2010-03-09 |