Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7965816 | Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes | Scott David Kravis, Karl E. Geisel, Karl Voigtland | 2011-06-21 |
| 7072440 | Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation | Scott David Kravis | 2006-07-04 |
| 6661867 | Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation | Scott David Kravis | 2003-12-09 |