Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7046373 | Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure | Giuseppe Coppola, Pietro Ferraro, Sergio De Nicola | 2006-05-16 |