Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9599580 | Diffractometry-based analysis method and associated diffractometer, particularly suitable for samples comprising multiple layers of materials | Caroline Paulus, Joachim Tabary | 2017-03-21 |
| 9285329 | Method of analysing a sample of material by diffractometry and associated diffractometer | Joachim Tabary, Caroline Paulus | 2016-03-15 |