NZ

Naohiro Zaima

CK Ckd: 1 patents #167 of 332Top 55%
Overall (All Time): #2,419,119 of 4,157,543Top 60%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12315133 Substrate foreign matter inspection device and substrate foreign matter inspection method Kazuyoshi Kikuchi, Tsuyoshi Ohyama, Norihiko Sakaida 2025-05-27