| #444 |
Erwin Reichel |
— |
1 |
| #444 |
Tandur Deepaknath |
Keysight Technologies |
1 |
| #444 |
Gustaf Winroth |
Imec |
1 |
| #444 |
Adelina K. Shickova |
Imec |
1 |
| #444 |
Andres Van Brecht |
Katholieke Universiteit Leuven |
1 |
| #444 |
Fabian Dortu |
Imec |
1 |
| #444 |
Victor V. Moshchalkov |
Imec |
1 |
| #444 |
Giberto Curatola |
Nxp B.V. |
1 |
| #444 |
Carl Van Lierde |
K.U. Leuven Research & Development |
1 |
| #444 |
Bart Maria Jozef Haex |
— |
1 |
| #444 |
Maarten Thewissen |
Imec Vzw |
1 |
| #444 |
Jos Stas |
GE |
1 |
| #444 |
Karel Jozef Van Brussel |
— |
1 |
| #444 |
Paulina Alejandra Rincon Delgadillo |
Imec Vzw |
1 |
| #444 |
Lieve Van Look |
Imec Vzw |
1 |
| #444 |
Shrivinas Dumbre |
K.U. Leuven Research & Development |
1 |
| #444 |
Cassio Faria |
Siemens Industry Software |
1 |
| #444 |
Chi Lim Tan |
Imec Vzw |
1 |
| #444 |
Wim Michel DE BORGGRAEVE |
The Procter & Gamble |
1 |
| #444 |
Stefano Granata |
Imec Vzw |
1 |
| #444 |
Sarp Kerman |
Imec Vzw |
1 |
| #444 |
Thierry Gilbert Claude Walrant |
Home Control Singapore Pte |
1 |
| #444 |
Karel Eeckhout |
Total Research & Technology Feluy |
1 |
| #444 |
Paolo Prospero Pescarmona |
Katholieke Universiteit Leuven |
1 |
| #444 |
Lieven De Cremer |
Katholieke Universiteit Leuven |
1 |
| #444 |
ir Rik W. A. A. De Doncker |
Rheinisch-Westfälische Technische Hochschule (Rwth) Aachen |
1 |
| #444 |
Kuo-Hsing Kao |
Imec |
1 |
| #444 |
Christiaan G. M. H. G. Van Damme |
Staar S.A. |
1 |
| #444 |
Omer C. J. Vanvuchelen |
U.S. Philips |
1 |
| #444 |
Philippe Meylemans |
Alcatel N.V. |
1 |
| #444 |
Steven T. F. Van Hulle |
U.S. Philips |
1 |
| #444 |
Rudi R. F. De Laet |
U.S. Philips |
1 |
| #444 |
Geert Luyckx |
Imec Vzw |
1 |
| #444 |
Dries Laleman |
— |
1 |
| #444 |
Kjell Cnops |
Imec Vzw |
1 |
| #444 |
Gert Heirman |
Siemens Industry Software |
1 |
| #444 |
Jolien RASSCHAERT |
Materialise N.V. |
1 |
| #444 |
Syuhei Aihara |
Materialise N.V. |
1 |
| #444 |
Bart Theys |
Katholieke Universiteit Leuven, Ku Leuven R&D |
1 |
| #444 |
Eli Voet |
Imec Vzw |
1 |
| #444 |
Patrick Blankaert |
Nikon Metrology Nv |
1 |
| #444 |
Ariumi Saneaki |
Imec Vzw |
1 |
| #444 |
Ken Verguts |
Imec Vzw |
1 |
| #444 |
Frederic Duflos |
Imec Vzw |
1 |
| #444 |
Francois Biscop |
— |
1 |
| #444 |
Luc K. Van Linthout |
— |
1 |
| #444 |
Hubert J. H. E. Vander Haeghe |
— |
1 |
| #444 |
Joseph A. G. Simons |
Leuven Research & Development Vzw |
1 |
| #444 |
Stefaan HOREMANS |
ICI |
1 |
| #444 |
Emmanuel J. Menten |
— |
1 |