Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12164400 | Telemetry-based model driven manufacturing test methodology | ShiJie Wen, Anthony E. Winston, Jie Xue, James Edwin Turman | 2024-12-10 |
| 12038479 | Stress-testing electrical components using telemetry modeling | James Edwin Turman, ShiJie Wen, Jie Xue, Zoe Frances Conroy, Anthony E. Winston | 2024-07-16 |
| 8611675 | Confusion matrix for classification systems | Jyh-Herng Chow, Byron Edward Dom | 2013-12-17 |