AC

Andrei Csipkes

CI Ciena: 20 patents #40 of 1,406Top 3%
AT AT&T: 17 patents #994 of 18,772Top 6%
📍 Lawrenceville, GA: #20 of 1,047 inventorsTop 2%
🗺 Georgia: #528 of 35,610 inventorsTop 2%
Overall (All Time): #90,978 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 26–37 of 37 patents

Patent #TitleCo-InventorsDate
5796894 Fiber optic connector with improved return loss performance John Mark Palmquist, Ian A. White 1998-08-18
5778132 Modular optical amplifier and cassette system Henry H. Yaffe 1998-07-07
5768401 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged John Mark Palmquist 1998-06-16
5768409 Automatic inspection method for contactlessly measuring an offset of a central feature of an object John Mark Palmquist 1998-06-16
5729622 Automatic inspection system for contactlessly measuring an offset of a central feature of an object John Mark Palmquist 1998-03-17
5724127 System and method for inspecting an end of a fiber optic Glen D. Porter 1998-03-03
5671049 System and method for contactlessly and automatically determining the return loss of an optical fiber connector John Mark Palmquist 1997-09-23
5657131 Alignment and lighting system and method for aligning and lighting an object for an inspection system that contactlessly measures an offset of a central feature of the object John Mark Palmquist 1997-08-12
5636020 Zone analysis system and method for optimizing the performance of an inspection system for determining disparity between two surfaces John Mark Palmquist 1997-06-03
5600439 Self-calibration system and method for determining the adequacy of an interferometer angle and surface curvatures in an inspection system for determining disparity between two surfaces John Mark Palmquist 1997-02-04
5543915 Autofocusing system and method for positioning an interferometric fringe over a target in an image John Mark Palmquist 1996-08-06
5535002 Band matching system and method for enabling accurate determination of a disparity between two surfaces using an interferometer John Mark Palmquist 1996-07-09