WL

Wen Tsung LI

CC Chunghwa Precision Test Tech. Co.: 2 patents #16 of 28Top 60%
Overall (All Time): #1,962,430 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10514390 Probe structure Kai-Chieh Hsieh, Chih-Peng Hsieh 2019-12-24
10060949 Probe device of vertical probe card Kai-Chieh Hsieh 2018-08-28