HW

Hsun-Tai Wei

CC Chunghwa Precision Test Tech. Co.: 6 patents #7 of 28Top 25%
Overall (All Time): #794,022 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
11933817 Probe card device and transmission structure Wen-Tsung Lee, Pang-Chi Huang, Meng-Chieh Cheng 2024-03-19
11287446 Split thin-film probe card Wen-Tsung Lee, Kai-Chieh Hsieh, Chao Liu 2022-03-29
11226354 Probe card device and fence-like probe thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2022-01-18
11209461 Probe card device and neck-like probe thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2021-12-28
11204371 Probe card device Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2021-12-21
11175313 Thin-film probe card and test module thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Chao Liu 2021-11-16