YL

You-Wei Li

CU Chung Yuan Christian University: 1 patents #145 of 438Top 35%
Overall (All Time): #2,498,524 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
11982802 Device and method for performing total internal reflection scattering measurement Cheng-An Lin, Tzu-Yin Hou, Yuh-Show Tsai, Ming-Chen Wang 2024-05-14