Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7474415 | Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display | Chern-Sheng Lin, Mau-Shiun Yeh, Chia-Hau Lin, Shih-Liang Ku | 2009-01-06 |