Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12327767 | Optical inspection apparatus in semiconductor process system | Hung-Tien Kao | 2025-06-10 |
| 11841218 | System and method of measuring surface topography | Chih-Yao Ting, Chia-Hung Lin, Hsin-Yun Chang | 2023-12-12 |
| 11269170 | Separate microscopy system and adjusting method thereof | Yu Wang, Tsung-Hsien Ou, Kuo-Wei Huang | 2022-03-08 |
| 10436580 | Surface measurement system | Yi-Chang Chiu, Cheng-Ting Tsai, Lan Yang, Hsiu-Wei KUO, Shao-En Chung | 2019-10-08 |
| 8638445 | Imaging apparatus and method thereof | Yu-Hsuan Lin, Hsin-Yueh Sung, Alvin Chang, Hung-Ta Chien | 2014-01-28 |