Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099025 | Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection | Lin Zheng, Shitao Dou, Xin Chen, Lunwu ZHANG, Jin Zhang +6 more | 2024-09-24 |
| 11319618 | Ti(C,N)-based superhard metal composite material and preparation method thereof | Ying-Cong Deng, Shan Jiang, Yanhua Zhang, Qiaowang Chen, Hui YAN +2 more | 2022-05-03 |