| 9417281 |
Adjustable split-beam optical probing (ASOP) |
Horst E Groneberg, Krishna Kuchibhotla |
2016-08-16 |
| 9217855 |
Multi-magnification high sensitivity optical system for probing electronic devices |
Thomas E Clawges, David Morgan |
2015-12-22 |
| 9182580 |
Optical probe system having accurate positional and orientational adjustments for multiple optical objectives |
Thomas E Clawges, David Morgan |
2015-11-10 |
| 9030658 |
Multi-resolution optical probing system having reliable temperature control and mechanical isolation |
David Morgan, Thomas E Clawges, Horst E Groneberg |
2015-05-12 |
| 9025147 |
Probing circuit features in sub-32 NM semiconductor integrated circuit |
Yaoming Shen |
2015-05-05 |
| 8873032 |
Optical probing system having reliable temperature control |
David Morgan, Thomas E Clawges, Horst E Groneberg |
2014-10-28 |
| 8749784 |
Probing circuit features in sub-32 nm semiconductor integrated circuit |
Yaoming Shen |
2014-06-10 |
| 6168311 |
System and method for optically determining the temperature of a test object |
Mario Paniccia |
2001-01-02 |
| 5537247 |
Single aperture confocal imaging system |
— |
1996-07-16 |
| 4927254 |
Scanning confocal optical microscope including an angled apertured rotating disc placed between a pinhole and an objective lens |
Gordon S. Kino |
1990-05-22 |
