Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11953542 | Test method for tolerance against the hot carrier effect | Xiaodong Luo | 2024-04-09 |
| 11380413 | Test system and test method | — | 2022-07-05 |
| 11048670 | Node layout determining method and apparatus, computing device, and computer readable medium | — | 2021-06-29 |