Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320830 | Method, device and system for measuring frequency domain characteristics, and storage medium | Yaqi Fang, Jianbin Liu | 2025-06-03 |
| 12222389 | Test board for testing memory signal | Honglong SHI | 2025-02-11 |
| 12032022 | Power consumption measurement assembly and method, and chip power consumption measurement device | Xinwang Chen, Zhangqin Zhou | 2024-07-09 |
| 11977116 | Current test circuit, device and method, and storage medium | Zhangqin Zhou, Xinwang Chen | 2024-05-07 |
| 11959938 | Package substrate, apparatus for testing power supply noise and method for testing power supply noise | Honglong SHI, Jianbin Liu | 2024-04-16 |
| 11933815 | Test fixture | Xinwang Chen, Zhangqin Zhou | 2024-03-19 |
| 11933842 | Board adapter device, test method, system, apparatus, and device, and storage medium | Jin Qian, Jianbin Liu | 2024-03-19 |
| 11893284 | Method, device and system for testing memory devices | Xinwang Chen, Jianbin Liu | 2024-02-06 |
| 11823756 | Method and device for testing memory array structure, and storage medium | Jianbin Liu | 2023-11-21 |