Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405570 | Method and device for compensating surface error of holographic grating substrate | Heshig Bayan, Shan Jiang, Yubo Li, Wei Wang, Wenhao Li +2 more | 2025-09-02 |
| 12392602 | Littrow grating interferometry device and use thereof | Wenhao Li, Wenyuan Zhou, Yujia Sun, Lin Liu | 2025-08-19 |
| 12392599 | Hybrid displacement measuring device | Bayan Heshig, Xinyu Wang, Shan Jiang, Wenhao Li, Wei Wang +1 more | 2025-08-19 |
| 12241739 | Bidirectional Littrow two-degree-of-freedom grating interference measurement device based on double gratings | Wenhao Li, Wenyuan Zhou, Yujia Sun, Lin Liu | 2025-03-04 |
| 12188793 | Heterodyne two-dimensional grating measuring device and measuring method thereof | Wenhao Li, Hongzhu Yu, Wei Wang, Rigalantu Ji, Xuefeng Yao | 2025-01-07 |
| 12188794 | Grating displacement measurement device and method using double-layer floating reading head, medium, and apparatus | Wenhao Li, Wenyuan Zhou, Shan Jiang, Wei Wang, Yujia Sun +3 more | 2025-01-07 |
| 11860057 | Heterodyne one-dimensional grating measuring device and measuring method thereof | Wenhao Li, Wei Wang, Hongzhu Yu, Rigalantu Ji, Xuefeng Yao | 2024-01-02 |