Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8981308 | Measurement of radiations of high influence by a capacitive element of MOS type | Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille | 2015-03-17 |
| 8234913 | Higher harmonics atomic force microscope | Paul Girard, Michel Ramonda | 2012-08-07 |