MO

Martin Oheim

CN CNRS: 1 patents #3,857 of 11,908Top 35%
UC Université Paris Cité: 1 patents #123 of 608Top 25%
Overall (All Time): #2,582,192 of 4,157,543Top 65%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11644422 Calibration standard for evanescence microscopy Adi SALOMON 2023-05-09