Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8502143 | Method, device and system for measuring nanoscale deformations | Martin Hytch, Florent Houdellier, Florian Hue | 2013-08-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8502143 | Method, device and system for measuring nanoscale deformations | Martin Hytch, Florent Houdellier, Florian Hue | 2013-08-06 |